Peter Hacke
Senior Scientist
NREL
Dr. Hacke performs research and consulting for durability testing, validation, and failure analysis of photovoltaic (PV) modules, inspections for root cause of module failures in the field, and accelerated lifetime testing, including for potential induced degradation (PID), power loss, corrosion, bypass diodes, and delamination.
His research interests are in modeling of degradation processes of PV modules, module integrated electronics/small inverters, relating accelerated test results to field tests, and developing new methods for analysis of PV degradation data. He also explores accelerated multi-stress and combined stress testing to better predict occurrences of failure modes seen in the field.
2 Dec 2021, 15:00
- 17:00 GMT (UTC)
Presentation
- Documentation needed when short-listing module suppliers and product types
- Current challenges to implement global testing and certification of modules
- Changes in testing procedures for new module designs and formats
